Advances in X-ray Analysis: Characterization, Calibration, and Applications
01About This Special Issue
Potential topics include, but are not limited to:
- Experimental and computational approaches for X-ray spectra characterization.
- Innovations in calibration procedures for X-ray detectors and imaging systems.
- Dosimetric applications of X-ray technologies in medical and industrial settings.
- Monte Carlo simulations for optimizing X-ray-based procedures.
- Advances in quality assurance and quality control in X-ray dosimetry.
- Evaluation and validation of international standards, such as ISO 4037:2019.
- Application of X-ray techniques in emerging fields like dental radiography and industrial inspections.
- Developments in X-ray imaging, including computed tomography (CT) and radiography.
02Meet the Guest Editors
Our distinguished editors bring deep subject-matter expertise to curate high-quality research and ensure a rigorous peer-review process.
Lead Guest Editor
Assia Arectout
Department of Physics, Abdelmalek Essaadi University, Tetuan, Morocco
Guest Editor
Houda Elyaakoubi
Department of Physics, Abdelmalek Essaadi University, Tetuan, Morocco
Guest Editor
Belhaj Omaima Essaad
Department of Physics, Abdelmalek Essaadi University, Tetuan, Morocco
Guest Editor
Ibtissam Zidouh
Department of Physics, Ibn Tofail University, Kenitra, Morocco
Guest Editor
Hamid Boukhal
Department of Physics, Abdelmalek Essaadi University, Tetuan, Morocco
Guest Editor
El Mahjoub Chakir
Department of Physics, Ibn Tofail University, Kenitra, Morocco
Guest Editor
Meryeme Bellahsaouia
Department of Physics, Ibn Tofail University, Kenitra, Morocco


